circuit design suite vulnerabilities and fixes
Recent CVEs affecting circuit design suite, with upgrade or downgrade steps. 7 tracked.
Also searched as: circuitdesignsuite.
circuit design suite has 7 tracked vulnerabilities, 0 critical. A fixed release or vendor patch exists for 7. Most recent: 2025-09-30. Highest priority: CVE-2025-30421 (score 30/100).
- CVE-2025-6034 HIGH 7.8 UPGRADE There is a memory corruption vulnerability due to an out of bounds read in DefaultFontOptions() when using Sym
- CVE-2025-6033 HIGH 7.8 UPGRADE There is a memory corruption vulnerability due to an out of bounds write in XML_Serialize() when using SymbolE
- CVE-2025-30421 HIGH 7.8 UPGRADE There is a memory corruption vulnerability due to a stack-based buffer overflow in DrObjectStorage::XML_Serial
- CVE-2025-30420 HIGH 7.8 UPGRADE There is a memory corruption vulnerability due to an out of bounds read in Bitmap::InternalDraw() when using t
- CVE-2025-30419 HIGH 7.8 UPGRADE There is a memory corruption vulnerability due to an out of bounds read in GetSymbolBorderRectSize() when usin
- CVE-2025-30418 HIGH 7.8 UPGRADE There is a memory corruption vulnerability due to an out of bounds write in CheckPins() when using the SymbolE
- CVE-2025-30417 HIGH 7.8 UPGRADE There is a memory corruption vulnerability due to an out of bounds write in Library!DecodeBase64() when using
FAQ
How do I fix circuit design suite vulnerabilities?
Open the CVE for your version, check the affected range, then follow the listed action: upgrade to the fixed release, or downgrade or mitigate if no fix exists yet. Commands for each OS are shown on every CVE page.
Is circuit design suite being exploited right now?
None of the tracked circuit design suite CVEs are on the CISA Known Exploited Vulnerabilities list at the moment. This is checked every 20 minutes.
Which circuit design suite CVE should I patch first?
CVE-2025-30421 currently ranks highest (30/100): There is a memory corruption vulnerability due to a stack-based buffer overflow in DrObjectStorage::XML_Serial.